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The dawn of artificial intelligence
Symmetry-Resolved Entanglement in AdS & BCFT
The power of symmetry through defects in quantum matter
环境学术沙龙第673期:Air Pollution, Climate Change, and their Interactions in...
报告题目:
Analytical Science for Systematic Manufacturing Design
 报告人:
Takahisa TSUGOSHI
Dr. 
Measurement Standard System Division
National Metrology Institute of Japan (NMIJ)
National Institute of Advanced Industrial Science and Technology (AIST)
Japan
报告时间:
2008-11-05 16:30
报告地点:
理科楼分析中心会议室(4203)
主办单位:
清华大学化学系
  简介:

Materials Processing; Material Characterization Techniques; Analytical Techniques for In-situ Monitoring Processing; The base of Science and Technology: Observation and Measurement

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