报告摘要：

Atomic force microscope (AFM) has become a quintessential tool for exploring nanoscale material properties. Specifically the last few years have witnessed a revolution of the capabilities offered by AFM to explore local physical phenomena at the nanoscale. In this presentation, I will present how material properties can be measured using AFM and, furthermore, summarize our recent effort on the development of the AFM techniques and application of advanced AFM techniques for exploring various local physical phenomena, e.g. piezoelectricity in 2D MoTe₂, ferroelectricity in CH₃NH₃PbX, BiFeO₃ and HfO₂, and electrochemistry in carbon and advanced high strength steels. In addition, I willbriefly discuss how we were able to tune material properties through point defect engineering.

个人简介：

Dr. Yunseok Kim is currently an associate professor at School of Advanced Materials Science and Engineering, Sungkyunkwan University. Dr. Kim received his Ph.D. degree in Materials Science and Engineering from Korea Advanced Institute of Science and Technology (KAIST) in 2007. He then conducted his postdoctoral researches at Max Planck Institute of Microstructural Physics from 2008 to 2010 in Germany and at Oak Ridge National Laboratory from 2011 to 2012 in USA. In Sep. 2012, he joined Sungkyunkwan University as a faculty member. His current research interests include nanoscale characterization of electrical, electrochemical, and electromechanical systems using atomic force microscopy, data analysis using machine learning algorithms, and development of characterization techniques based on atomic force microscope and machine learning. So far he has published 177 papers in leading journals including Science, Energy & Environmental Science, Materials Science & Engineering R-Reports, Advanced Materials, etc. He serves as Director of Korean Society of Microscopy and committee of several other academic societies in Korea.