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第451期“工物学术论坛”: 瑞士灾害风险管理方法与经验
Multi-dimensional Electron Microscopy for In-plane and Out-of-planeNanoscale ...
Coupled-chain analysis of Kitaev materials
“清美”沙龙 | 中国现代化设计史的研究维度
报告题目:
基于内核SOC系统的可测试性设计
 报告人:
Hideo Fujiwara
报告时间:
2005-07-15 09:00
报告地点:
清华大学,软件学院教学楼217
主办单位:
清华大学软件学院
  简介:
 Prof. Hideo Fujiwara held a Ph.D from Osaka University in 1974. He became a full Professor of Meiji University in 1993. He has been with Nara Institute of Science and Technology since 1993 as a full Professor. His research interests include design and test of digital systems, parallel/distributed processing, fault-tolerant computing, and computational complexity. He proposed a classic test generation algorithm called the FAN algorithm. He has been an IEEE Fellow since 1989. He has served IEEE Trans. on Computers as an Associate Editor and Many other International Journals.
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