简介: |
第九届国际智能质量控制学术会议（IXth International Workshop on Intelligent Statistical Quality Control）定于2007年9月12-14日在北京市清华园宾馆举行，会议注册费1500元。
本次会议预计有60名代表参加（其中海外代表40人）。他们是来自美国、加拿大、德国、英国、荷兰、瑞典、波兰、希腊、日本、中国香港等国家和地区的代表，以及来自中国大陆中国科学院、清华大学、富士康公司及其他大学、研究机构的代表。
会议主题为：介绍智能质量控制在制造业、物流与供应链和商业流通中的应用，以及这些学科领域的重要研究成果及前沿课题。组织者将通过这次智能质量控制国际学术会议，提供给参与人进行学术思想交流以及研究成果展示的学术平台。
智能质量控制是制造业、物流与供应链和商业流通等研究领域的重要研究方向，关系到一个国家工业发展水平和经济发展趋势与动向。应德国柏林Freie大学Hans-J. Lenz和Peter-Th.Wilrich 两位教授的邀请和建议，我们组织了这次国际学术会议，并且邀请了来自世界十多个国家及地区的知名学者、研究专家、企业代表，希望能够推动我国在质量控制与质量管理领域的进步和发展。已经应邀来参加的这些专家学者大部分都是本领域中的国际顶尖级著名专家，在国际上有重要学术地位，同时对于智能质量控制有着深刻和重要的见解。
-会议组织人：
李泉林、陈实、张勤勤
清华大学工业工程系
Phone: 86-10-62783243 (O)
13521978091（李）
13810702679（陈）
13811134470（张）
IXth Intl. Workshop on Intelligent Statistical Quality Control
Department of Industrial Engineering Tsinghua University, Beijing
Sep 12-14, 2007
Wednesday, 12th Sep. 2007
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9.00 - 9.15 |
Opening Adress |
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Surveillance Sampling and SPC I |
Chair: Wilrich, Peter T. |
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9.15 - 9.45 |
Frisen, Marianne |
Principles for multivariate surveillance |
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9.45 - 10.15 |
Baillie, David H. |
Surveillance sampling schemes by attributes |
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10.15 - 10.45 |
Woodall, William H. |
The use of control charts and scan methods in public health surveillance |
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10.45 - 11.00 |
Discussion |
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11.00 - 11.25 |
Coffee Break |
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SPC II |
Chair: Schmid, Wolfgang |
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11.25 - 11.50 |
Knoth, Sven et al. |
Misleading signals in simultaneous schemes for the mean and the variance of a time series |
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11.50 - 12.15 |
Reynolds, Marion R. and Stoumbos, Zachary G. |
Multivariate monitoring of the process mean and variability using combinations of Shewhart and MEWMA control charts |
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12.15 - 12.30 |
Discussion |
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12.30 - 14.00 |
Lunch |
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SPC III and Capability |
Chair: Adams, Mike |
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14.00 - 14.25 |
Matsuura, Shun |
Partitioning methods in selective assembly to minimize clearance variation when measurement error is present |
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14.25 - 14.50 |
Psarakis, Stelios, and
Hadjimichael, Yiannis |
Neural Networks and Statistical Control:
An Overview |
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14.50 - 15.15 |
Spiring, Fred, and Leung, Bartholomew P. K. |
The sensitivity of common capability indices to departures from normality |
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15.15 - 15.30 |
Discussion |
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15.30 - 16.00 |
Coffee Break |
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Monitoring and SPC IV |
Chair: Woodall, Bill |
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16.00 - 16.25 |
Tsui, Kwok and
Jiang, Wei, |
Dynamic modeling and activity monitoring of complex systems |
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16.25 - 16.50 |
Tsung, Fugee and
Wang, Kaibo, |
Adaptive charting schemes with tracking and learning abilities: Review and extension |
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16.50 - 17.15 |
Colosimo, Bianca M., et al. |
Quality control of manufactured surfaces |
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17.15 - 17.30 |
Discussion |
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Thursday, 13th Sep. 2007
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Modelling |
Chair: Li, Quan-lin |
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9.00 - 9.25 |
Collani, Elart v., and
Baur, Karl |
Stochastic modelling as tool for quality assessment and quality improvement illustrated by means of nuclear fuel assemblies |
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9.25 - 9.50 |
Zhai, Xiaomin |
The problem of defining and modelling quality and E-learning programme |
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9.50 - 10.15 |
Kumar, Naveen, et al. |
Hierarchical modelling using Generalized Linear Models |
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10.15 - 10.40 |
Discussion |
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10.40 - 11.00 |
Coffee Break |
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SPC V and Monitoring |
Chair: Lenz, Hans-J. |
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11.00 - 11.25 |
Cheng, Smiley W., and
Thaga, Keoagile |
Max-CUSUM chart |
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11.25 - 11.50 |
Hryniewicz, Olgierd, and
Szediw, Anna |
Nonparametric methods for statistical process control (SPC) |
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11.50 - 12.15 |
Iwersen, Jorgen, and
Melgaard, Henrik |
Using ISO-standard principles to monitor processes in industrial settings |
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12.15 - 12.30 |
Discussion |
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12.30 - 14.00 |
Lunch |
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Data Quality |
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Chair: Baillie, David |
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14.00 - 14.30 |
Gob, Rainer |
Aspects of statistical control in auditing |
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14.30 - 15.00 |
Lenz, Hans-J. and
Koppen, Veit |
Data quality control based on metric data models |
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15.00 - 15.30 |
Discussion |
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15.30 - 16.00 |
Coffee Break |
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Sampling, SPC VI and Exp. Design I |
Chair: v. Collani, Elart |
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16.00 - 16.25 |
Wilrich, Peter-Th. |
A new approach to Bayesian sampling plans |
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16.25 - 16.50 |
Higashide, Masanobu, et al. |
Practice of statistical process control in semiconductor manufacturing process |
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16.50 - 17.15 |
Hong, Micro and
Li, Quan-Lin |
Reliability experimentations for lead-free solder joint of BGA assemblies |
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17.15 - 17.30 |
Discussion |
Friday, 14th Sep. 2007
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Reliability, Quality and Exp. Design II |
Chair: Ojima, Yoshikazu |
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9.00 - 9.30 |
Chang, Yuan-Tsung |
A note on the estimation of restricted scale parameters of Gamma distributions |
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9.30 - 10.00 |
Kametani, Tsuyoshi and
Nishina, Ken |
Attractive quality and must-be quality from the viewpoint of the environmental lifestyle in Japan |
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10.00 - 10.30 |
Yasui, Seiichi, et al. |
On identifying dispersion effects in unreplicated fractional factorial experiments |
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10.30 - 10.45 |
Discussion |
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10.45 - 11.15 |
Coffee Break |
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Experimental Design III |
Chair: Reynolds, Marion R. |
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11.15 - 11.45 |
Suzuki, Tomomichi, et al. |
A study on adaptive paired comparison experiments |
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11.45 - 12.15 |
Yamasaki, Motohiro,
et al. |
Interval estimation of reproducibility in the staggered nested designs for the precision experiments |
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12.15 - 12.30 |
Discussion |
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12.30 - 14.00 |
Lunch |
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