(1) Treatment of systematic measurement deviations

Concerning systematic effects, the recommendation given in the GUM is to correct for them, but unfortunately no detailed information is available, how to do this. This lecture will show, how systematic measurement deviations can be handled correctly based on the Bayesian probability theory. After a short overview about useful methods and tools, like the product rule of probability theory, Bayes' theorem, the principle of maximum entropy, and the marginalisation equation, an outline of a method to handle systematic measurement deviations is introduced. Finally some simple examples of practical interest are given, in order to demonstrate the applicability of the suggested method.

(2) New filter concepts according to ISO 16610

For the past ten years, a group of international experts in the International Organisation for Standardisation (ISO) has been working on a new concept for geometrical filters. This effort was motivated by an urgent need in industry to define the terms, concepts, and techniques involved in reducing raw data collected by measurements for proper interpretation while inspecting manufactured parts to verify whether they meet their tolerance specifications. This lecture describes the results of this work leading to the ISO/TS 16610 series of standards about profile filters.

报告人简历

1971年进入柏林理工大学，主修物理并兼修数学，1976年毕业获物理学硕士学位；1978年获博士学位。在学期间，曾在德国国家物理技术研究院柏林研究所工作，获博士学位后，曾留任柏林理工大学理论固体物理研究中心，1979年至今，在位于布伦瑞克市的德国国家物理技术研究院（总部），从事科研工作，其中1979-1990年在光学研究部；1990年至今在精密仪器研究部。1984年获德国政府认定的高级职称“German senior government councillor and scientist”。在国际标准组织ISO和德国国家标准机构DIN以及美国国家标准机构ASME等组织中，担任重要职务，2003年起任测量和仪器国际委员会(ICMI)理事会常任理事。多次被德国和世界各地的大学和研究机构邀请做学术报告。拥有的专利Invention of the Spline filter在geometrical inspection of parts in industry中，有效提高了the data processing of coordinate measurement machines in scanning mode，已被广泛应用于汽车工业、石油工业、机械制造、电子、航空航天领域。