学术报告

【主题】 Small Delay Defect Testing and other Testing Issues

【主讲】 Prof. Krishnendu Chakrabarty, IEEE Fellow, Dept. of Electrical and Computer    Engineering, Duke University

【时间】 2008年12月18号 上午9：30

【地点】 软件学院教学楼222教室

【简介】 Krishnendu Chakrabarty

Krishnendu Chakrabarty(S’92–M’96–SM’01–F’08)is currently a Professor with the Electrical and Computer Engineering Department, Duke University, Durham, NC. He has authored five books and published 280 papers in archival journals and refereed conference proceedings. He served as a Distinguished Visitor of the IEEE Computer Society for 2005 2007 and a Distinguished Lecturer of the IEEE Circuits and Systems Society for 2006 2007. Currently, he serves as an ACM Distinguished Speaker. He is an Associate Editor of the IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS, IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS, IEEE TRANSACTIONS ON BIOMEDICAL CIRCUITS AND SYSTEMS, ACM Journal on Emerging Technologies in Computing Systems, an Editor of the IEEE Design & Test of Computers, and an Editor of the Journal of Electronic Testing: Theory and Applications (JETTA). He served as Program Chair for the IEEE Asian Test Symposium in 2005 and the CAD, Design, and Test Conference for the 2007 IEEE Symposium on Design, Integration, Test, and Packaging of MEMS/MOEMS.

Current research projects include: testing and design-for-testability of system-on-chip integrated circuits; digital microfluidic biochips; logic circuits based on DNA self-assembly; delay-tolerant wireless networks.

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