Abstract:
Since many years electron backscatter diffraction (EBSD) is a standard tool for the crystallographic characterization of materials and microstructures in scanning electron microscope (SEM). Despite an enormous progress in data acquisition and development of orientation interpretation tools, Kikuchi pattern are still processed without any remarkable change. This presentation will demonstrate which information is hidden in a Kikuchi patterns and how this knowledge can be used. For example of AIIIBV semiconductor materials, the breakdown of Friedels law will be demonstrated and its impact on other applications, such as strain determination and point-group sensitive mappings, will be discussed. The applied cross-correlation of simulated and experimental patterns offers a wide range of further applications  which are also beneficial for centrosymmetric phases. Typical possibilities are the substitution of pseudo-symmetric solutions in maps caused by systematic misinterpretation of bands (e.g. pyrite, quartz), the increase of orientation precision, or the consideration of diffracted intensity during indexing.

About the speaker:
Dr. Gert Nolze graduated in crystallography. He obtained his PhD in 1991 from Leipzig University (Germany). After working in Academy of Science he joined the Federal Institute for Materials Research and Testing (BAM) in 1992. Responsible for residual stress evaluation in constructive materials using X-ray diffraction he substantially developed the software PowderCell, a free tool for intuitive crystal structure manipulations and X-ray powder diffraction simulations. In 2000 he became responsible for the electron backscatter diffraction (EBSD) facility in BAM. In 2008 he was hired for three years by Bruker Nano in order to develop a new EBSD system. Back since 2011 he is now head of the Local Phase Analysis group in BAM. Since 2002 he is organizing the annual German EBSD meetings.