A new paradigm is presented to advance the state-of-the-art in understanding the coupling of electromagnetic waves within large interconnected networks of complicated metallic enclosures and exposed to high-power microwave (HPM) radiation. This paradigm is based on uniting the “Random Coupling Model (RCM)” developed by researchers at the University of Maryland in the early 2000s with the “Baum-Liu-Tesche (BLT) EM Topology” model developed in the 1980s to provide a quick solution to the statistical description of induced fields and voltage levels within closed volumes. The RCM and BLT EM Topology are widely recognized as the two leading and highly successful wave-scattering models describing the interaction of short wavelength EM radiation within complicated enclosures, and the interaction of interconnected networks of large complicated enclosures, respectively.

He received the B.S. and M.S. degrees from Columbia University in 1979 and 1981, respectively. He received his Ph.D. degree in Applied Physics from Cornell University in 1988. He is a Professor in the Electrical and Computer Engineering Department at the University of New Mexico, Albuquerque, NM, USA. He is the Director of the Pulsed Power, Beams, and Microwaves Laboratory. He was the General Chair of the IEEE Pulsed Power and Plasma Science 2007 Conference. He is a Senior Editor for the IEEE Transactions on Plasma Science, an Associate Editor for the Journal of Electromagnetic Waves and Applications, a Fellow of the IEEE, member of the IEEE Nuclear and Plasma Science Society’s Pulsed Power Science & Technology Committee, a member of the American Physical Society, and a member of the Cornell Society of Engineers.