Abstract:
Fabrication, structure and property are the three keypoints for materials science. In this talk we would like to present that Transmission Electron Microscopy(TEM) as a powerful high spatial resolution characterization tool offers an exceptional chance to establish links between these three in low dimensional materials, especially in the two dimensional materials, like graphene, transition metal dichalcogenides(TMD) or black phosphorous(BP).
The sub-topics will include: the electrical properties across the grain boundary in MoS2 which can be exactly explained by the structres determined by high resolution TEM and density functional theory(DFT); the electrical contact effect after phase transition in MoTe2 and the new linear defects; Determine the elastic bending rigidity of atomistic layers from the high resolution TEM images; The monolayer Fe embedded in graphene and the atom/cluster dynamics, etc.