Ion mobility spectrometry (IMS) is an analysis technique in which charged particles or ions in the gas phase are driven electrostatically to migrate through a background gas.  The speed the charged particle moves in the electrical field is determined by its mobility, which is a measure of the particle’s net charge divided by the drag force imparted by the background gas.  My laboratory group specializes in the development of new IMS technologies and the development of new IMS based measurement methods.  In this talk, such developments will be reviewed, including (1) the development of a nanoparticle drift tube ion mobility spectrometer, from lab prototype to a commercial instrument, (2) the development of IMS-mass spectrometry data deconvolution routines for the analysis of combustion generated particles, and (3) the extension of IMS to examine nanomaterials in the liquid phase. 

      

Biography:  Chris Hogan is an associate professor in the department of mechanical engineering at the University of Minnesota.  His research focuses on transport phenomena in aerosols, the design of gas phase measurement instruments, and the application of aerosol technology in additive manufacturing.  He has published more than 80 peer-reviewed papers on these topics, which have been cited more than 2800 times (google scholar).  He received his undergraduate degree from Cornell University, his PhD from Washington University in Saint Louis, and was a Postdoctoral Associate at Yale University before joining the University of Minnesota faculty in 2009.  He is the recipient of the Sheldon K. Friedlander Award in 2011 from the American Association for Aerosol Research, the 2013 Smoluchowski Award from the German Aerosol Research Society, and was a 2010 Japan Society for the promotion of science visiting faculty fellow.