Optical techniques based on thermoreflectance have emerged as a reliable and flexible way to measure the thermal transport properties of materials, including thermal conductivity, thermal boundary resistance, heat capacity, and microscale quantities such as the mean free paths of phonons and electron-phonon coupling strength. In this talk, I will focus on the development and application of frequency domain thermoreflectance (FDTR) methods for studying thermal  transport. In addition, I will discuss the benefits of extending thermoreflectance measurements into high-resolution scanning microscopy techniques.

报告人简介

Aaron Schmidt is currently a research scientist at Massachusetts Institute of Technology. He is the founder and CEO of Fourier Scientific LLC. He was an Assistant Professor of Mechanical Engineering at Boston University from 2010 to 2018. He received his PhD in Mechanical Engineering in 2008, under the supervision of Prof. Gang Chen at MIT. His research interests include fundamental studies of heat transfer and energy conversion, laser–material interaction, and optical metrology and microscopy.