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Progress and Prospects for Atomic-Resolution Electron Microscopy
David J. Smith
Department of Physics, Arizona State University, Tempe, AZ 85287
abstract
The recent emergence of both online and offline aberration correction methods has pushed the resolving power of the electron microscope to beyond the 1-Å resolution barrier, which was once thought to be unattainable. This extreme imaging capability has brought novel opportunities and fresh challenges for the electron microscopy community. Microscopists are actively exploring novel operating modes and establishing routine operating conditions, while also paying closer attention to the challenges of sample preparation, quantitative image interpretation, and avoiding or at least minimizing the effects of specimen damage caused by the intense electron beam. This talk will provide an overview of recent progress in atomic-resolution TEM and STEM imaging, and briefly discuss some of the ongoing problems that warrant further attention.
Speaker biography
David Smith is Regents’ Professor of Physics at Arizona State University, and Past President of the Microscopy Society of America. He received his Ph.D. in Physics (1978) and D.Sc. (1988) from the University of Melbourne, Australia. He served as Director, Cambridge University High Resolution Electron Microscope (1980 to 1984) and Director, ASU Center for High Resolution Electron Microscopy (1991 to 2006). He is the author/co-author of 20 book chapters and over 450 refereed journal publications, and he is a Fellow of the Materials Research Society, the American Physical Society and the UK Institute of Physics. His long-term research interests have centered on the development and applications of atomic-resolution electron microscopy, with recent interests in semiconductor heterostructures and magnetic thin films and nanostructures.
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