from    
to    
search  

 


可控裂结芯片上的单分子电子学研究
Minitalk 1:Isolating the isotopic characteristics (14C, δ13C) of dissolved i...
Advanced Multi-scale Characterisation of Subsurface: Unveiling theInfinite Po...
On the Way to Single-Cell Metabolome Analysis
报告题目:
基于内核SOC系统的可测试性设计
 报告人:
Hideo Fujiwara
报告时间:
2005-07-15 09:00
报告地点:
清华大学,软件学院教学楼217
主办单位:
清华大学软件学院
  简介:
 Prof. Hideo Fujiwara held a Ph.D from Osaka University in 1974. He became a full Professor of Meiji University in 1993. He has been with Nara Institute of Science and Technology since 1993 as a full Professor. His research interests include design and test of digital systems, parallel/distributed processing, fault-tolerant computing, and computational complexity. He proposed a classic test generation algorithm called the FAN algorithm. He has been an IEEE Fellow since 1989. He has served IEEE Trans. on Computers as an Associate Editor and Many other International Journals.
今日相关信息
视频编码技术联合学术报告会 -- H.264/A...
Advances in Nanotechnology
 
同类别相关信息
清华-爱泼斯坦国际传播系列讲座(四)T...
清华-爱泼斯坦国际传播系列讲座(三)M...
清华-爱泼斯坦国际传播系列讲座(二)E...
清华-爱泼斯坦国际传播系列讲座(一)W...
清华大学科学哲学和技术哲学沙龙第118...
学术活动