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可控裂结芯片上的单分子电子学研究
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报告题目:
Instability and Buckling Analysis of Si Film in a Stretchable Silicon System
 报告人:
Chun Lu, Ph. D.
Large Scale Complex Systems Division
Institute of High Performance Computing, Singapore
报告时间:
2006-06-16 10:00
报告地点:
清华大学 逸夫技术科学楼 力学系多功能报告厅 (1512)
主办单位:
清华大学航天航空学院固体力学研究所
  简介:

ABSTRACT

    A stretchable form of single-crystal silicon was produced by a research group in UIUC and reported in Science Journal early this year.  In this system, a wavy type of Si film was formed on elastomeric substrates. The wavelength and amplitude of wavy structures was predicted by a 2D theoretical model, in which the infinite assumption is adopted and the tangential traction along the interface is assumed to be zero in order to have an analytical solution. However, the observed results showed that the boundary effects play a role in the buckling and post-buckling behavior of the system.  In this work, a numerical investigation is conducted. A finite element model of the system is developed and used to predict the buckling patterns of the system and the traits of a wavy Si structure in the post-bucking state. Interesting results are observed from the simulation.

    Our activities in industrial applications and research work, as well as the computing facilities and organization setup will be also introduced and reviewed in this talk.

 

Brief Biography

Dr. Lu Chun is a senior scientist at Institute of High Performance Computing, Singapore and he also takes the role of division manager for Large Scale Complex System Group. Prior to joining IHPC, he was a principal engineer at Chartered Industries of Singapore. Dr. Lu received his PhD from National University of Singapore and Bachelor degree in Mechanics from Peking University. Dr Lu’s research interests include structure response under dynamics loading, multiscale simulation, computational micro/nano mechanics. He has published about 100 journal and conference papers in these fields.
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