清华大学材料科学与工程研究院《材料科学论坛》

学术报告

1.      Dr. Cheng wenhai

Nano Manipulator-SEM system

(E Micron Technologies Ltd)

2.      Dr. Oleg Lourie

SPM-TEM systems in situ characterization

(Nanofactory Instruments AB,  Swede)

时间： 2007年1月22日（星期一）10：00 am 开始

地点： 清华大学材料院学术报告厅（逸夫技术科学楼2－321）

欢迎广大师生踊跃参加!

联系人：舒红 62772507

The mechanical, electronic and refractive properties of the nanostructures can be studied in TEM using SPM-TEM systems such as STM?TEM, TEM?Nanoindenter and AFM-TEM. Specifically the conductivity, elastic constants and the mechanical strength can be measured for individual nanostructure such as nanowire or nanotube. Combined with the simultaneous HRTEM imaging, EDS and EELS analysis it leads to the full in-situ nano-characterization of the nanostructures.