简介: |
Short Bio:
Dr. Shiyan Hu received the Ph.D. degree in Computer Engineering from Texas A&M University, TX, USA, in 2008. He is currently an Assistant Professor in Department of Electrical and Computer Engineering at Michigan Technological University, MI, USA, where he is the director of Michigan Tech VLSI CAD Research Lab. He has been with IBM Research (Austin) as a Visiting Professor during summer 2010. His research interests are primarily in Computer-Aided Design of VLSI Circuits and Smart Grid System. He has served as the Technical Program Committee (TPC) members for a number of conferences such as IEEE/ACM Design Automation Conference and IEEE/ACM International Conference on Computer-Aided Design. He is a senior member of IEEE.
Abstract:
Cybersecurity has imposed significant challenge in the smart grid system design, which can impact power transmission system, power distribution system and end use. In this talk, I will first introduce the smart meter tampering issue in the advanced metering infrastructure. I will then highlight our recent work on the strategic Feeder Remote Terminal Unit (FRTU) deployment for detecting smart meter tampering based on the cross entropy optimization and the conditional random field techniques. Our technique can effectively detect the tampering while considering distribution network expansion, i.e., future load growth. I will also describe the other work on cybersecurity analysis for power transmission network considering Intelligent Electrical Device (IED) hacking. Finally, I will briefly overview our ongoing work on smart home scheduling including deterministic and stochastic demand side management. |
