报告摘要：
1) Electromagnetic compatibility
2) Development methodology applied in Industry
3) Modeling techniques fundamentals for EMC in Pspice
4) Examples and return on experience
5) Introduction to near field techniques
报告人简介：
Frédéric Lafon started EMC about 20 years ago. In parallel with his professional activities, he obtained his Master degree in EMC in 2004 from University of Clermont-Ferrand in France and received his PhD in 2011 related to immunity modeling aspects from integrated circuit to product performances predictions, from INSA of Rennes.
He started at UTAC in 1996 on the validation and certification of vehicles for EMC aspects, before joining Renault in France where he was leader for the qualification testing.
His activities are mainly focused on the development of modeling techniques, tools and methodologies to support Valeo projects design and anticipate EMC performances.
He developed modeling techniques for immunity (ICIM-CI) and for ESD (ICPI-ESD) based on black box approach, as well as for radiated emissions (ICEM-RE), based on near field cartography test bench development. In parallel he developed new characterization methods such as the near field immunity technique for ESD to investigate disturbance mechanism on products and IC.
His field of expertise is from integrated circuits up to system and architecture design and especially for electrical vehicle applications, with co design and co simulation development with OEM.
Presently he is manager of the worldwide EMC expertise team of Valeo and has in charge about 15 people in France and China especially. |
