报告摘要：

This presentation will show basic EMI scanning, the Emission Source Microscopy for f> 5 GHz, and ESD scanning in 90 minutes.

This presentation will demonstrate different methods on how to use an oscilloscope for EMC analysis and how to deal with different aspects of spectrum analysis including detectors, real-time spectrum analysis for EMC, and analysis of switched mode power supplies. Further, this presentation will show aspects of the limits of oscilloscopes, such as spurious free dynamic range and the measurement of very small signals.

 

报告人简介：David Pommerenke received his diploma in Electrical Engineering from the Technical University in Berlin emphasizing on the area of microwave engineering. In 1995, he received his Ph.D. also from the Technical University Berlin in the area of High Voltage Engineering with emphasis on pulsed effects such as electrostatic discharge. After staying one year for post doc he joined Hewlett Packard in Roseville, CA, USA (1996) focusing on the development of EMC test methods and continuing his high voltage research relate to partial discharge on 100-400 kV cables. In 2001, he joined the faculty of the electrical engineering department of the Missouri University of Science and Technology (at that time named University Missouri Rolla). As member of the EMC laboratory (emclab.mst.edu) he focused on electrostatic discharge, near field scanning, and a wide range of EMC problems ranging from automobile to IC design. In 2007, he co-founded Amber Precision Instruments (San Jose, CA www.amberpi.com) a company that focuses on the commercialization of EMC test methodologies. These technologies are mainly centered around robotic emissions measurements, robotic immunity measurements and fully automatic ESD testing using 5 or 6 axis robots.