摘要：
 Newly developed achromatic electron optics allows the use of wide energy windows and makes feasible energy-filtered transmission electron microscopy (EFTEM) at atomic resolution. In this Letter we present EFTEM images formed using electrons that have undergone a silicon L-2,L-3 core-shell energy loss, exhibiting a resolution in EFTEM of 1.35 angstrom. This permits elemental mapping beyond the nanoscale provided that quantum mechanical calculations from first principles are done in tandem with the experiment to understand the physical information encoded in the images.

报告人：
Professor Knut Urban, Senior Professor at Juelich-Aachen Research Alliance, used to be the director at the Institute for Solid State Research, National Research Center Julich;
Professor Urban has worked in many fields of advanced solid-state physics. Among these are point defects in metals, quasictrystals, complex metallic alloys, high-temperature superconductors, and dielectric oxides. Together with Harald Rose and Max Haider he was a member of the team which succeeded during the nineteen nenties to develop aberration corrected electron lenses. In 2007 he received the Von Hippel Award of the MRS. Together with Harald Rose and Max Haider he was awarded the 2008 Honda Prize for Ecotechnology and the 2011 Wolf-Prize in Physics.