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报告题目:
第九十一期“工物学术论坛”系列报告会(三):Spectral Games: CT Spectroscopy, CT Artifacts and Artifact Reduction
 报告人:
Marc Kachelrieß
Professor of Medical Imaging at the Institute of 
Medical Physics, University Erlangen-Nürnberg.
报告时间:
2014-05-22 14:00
报告地点:
紫光国际交流中心二层 宴会厅
主办单位:
工物系
  简介:
Today, dual energy CT (DECT) is widely available in clinical CT systems. The way the modality is implemented differs significantly from manufacturer to manufacturer. While being intended to provide additional contrast, i.e. spectroscopic information, DECT is often misused as an artifact reduction technique. Technical details of dual energy CT and of its use cases will be highlighted to get an understanding of today’s spectral CT technology. The presentation will further discuss alternative methods for artifact reduction. Last but not least we will take an excursion to the field of photon counting energy-selective detectors and discuss this new technology in comparison to DECT.
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